• New
IEC 62951-9 Ed. 1.0 en:2022
search
  • IEC 62951-9 Ed. 1.0 en:2022

IEC 62951-9 Ed. 1.0 en:2022

$189.00

Semiconductor devices - Flexible and stretchable semiconductor devices - Part 9: Performance testing methods of one transistor and one resistor (1T1R) resistive memory cells

Quantity

  Security policy

(edit with the Customer Reassurance module)

  Delivery policy

(edit with the Customer Reassurance module)

  Return policy

(edit with the Customer Reassurance module)

Full Description

This part of IEC 62951 specifies the test methods for evaluating the performance of unipolar-type one transistor one resistor (1T1R) resistive memory cells. The performance test methods in this document include read, forming, SET, RESET, endurance and retention. This document is applicable to flexible devices as well as rigid resistive memory devices without any limitations prone to device technology and size.

See more

R00002209
4515 Items
chat Comments (0)
No customer reviews for the moment.