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IEC 62899-402-1 Ed. 2.0 en:2025
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Full Description
This part of IEC 62899 specifies the measurement methods of the width of line pattern and spaces between the line patterns in printed electronics. These printed line patterns are treated as two-dimensional on a substrate. When the patterns are definitely affected by three-dimensional configurations, these are specified in measurement methods for vertical variance in printed electronics.
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R00000863
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