IEC 61788-15 Ed. 2.0 en:2026

Full Description

IEC 61788-15:2026 part of IEC 61788 describes measurements of the intrinsic surface impedance (ZS) of HTS
films at microwave frequencies by a modified two-resonance mode dielectric resonator method
[14], [15]. The object of measurement is to obtain the temperature dependence of the intrinsic
surface impedance, ZS, at the resonant frequency f0.
The frequency and thickness range and the measurement resolution for the ZS of HTS films are
as follows:
– frequency: up to 40 GHz;
– film thickness: greater than 50 nm;
– measurement resolution: 0,01 mΩ at 10 GHz.
It is crucial that the ZS data at the measured frequency, and that scaled to 10 GHz be reported
for comparison, assuming the f2 rule for the intrinsic surface resistance, RS (f 40 GHz), and
the f rule for the intrinsic surface reactance, XS.