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IEC 60749-5 Ed. 3.0 b:2023
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  • IEC 60749-5 Ed. 3.0 b:2023

IEC 60749-5 Ed. 3.0 b:2023

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Semiconductor devices - Mechanical and climatic test methods - Part 5: Steady-state temperature humidity bias life test

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Full Description

This part of IEC 60749 provides a steady-state temperature and humidity bias life test to evaluate the reliability of non-hermetic packaged semiconductor devices in humid environments.

This test method is considered destructive.

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