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IEC 60747-5-18 Ed. 1.0 en:2026
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Semiconductor devices - Part 5-18: Optoelectronic devices - Light emitting diodes - Test method of the macro photoluminescence for epitaxial wafers of micro light emitting diodes
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Full Description
IEC 60747-5-18:2026 Specifies the measuring methods of macro photoluminescence (PL)
for red, green, and blue epitaxial wafers of micro light emitting diodes (LEDs) prior to chip
fabrication processes. Wafer sizes being considered are 4 in, 6 in, and 8 in in diameter.
R00000266
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