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IEC 60747-18-4 Ed. 1.0 en:2023
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Semiconductor devices – Part 18-4: Semiconductor bio sensors – Evaluation method of noise characteristics of lens-free CMOS photonic array sensors
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Full Description
This part of IEC 60747 specifies the evaluation method for noise characteristics of lens-free CMOS photonic array sensors. This document includes the measurement setup, test procedure, test items, evaluation method, and test report for noise characteristics of lens-free CMOS photonic array sensors.
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R00002066
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